13/30281604 DC
13/30281604 DC
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13/30281604 DC

BS ISO 14706. Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy

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13/30281604 DC

BS ISO 14706. Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy

Purchase Options: Immediate PDF Download

Printed publication for Next Day or Standard Delivery
Price:  £20 (50% discount for members - click here for more information)

13/30281604 DC

BS ISO 14706. Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy

Purchase Options: Immediate PDF Download

Printed publication for Next Day or Standard Delivery
Price:  £20 (50% discount for members - click here for more information)
Product details for 13/30281604 DC
Category: CHEMICAL TECHNOLOGY

Publication date:

Product detail: 31 pages

ISBN reference: 0000000000000

Cross references to standards relating to 13/30281604 DC:

Keywords: Surface chemistry, Surface properties, Surfaces, Surfactants, Chemical analysis and testing, Contamination, Contaminants, Silicon, Substrates (insulating), X-ray fluorescence spectrometry, X-ray analysis, Fluorimetry, Reflection, Atoms, Density, Epitaxial layers

Variations and abbreviations: 13/30281604DC,13/30281604 DC

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