14/30283939 DC
14/30283939 DC
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14/30283939 DC

BS EN 15991. Testing of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)

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14/30283939 DC

BS EN 15991. Testing of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)

Purchase Options: Immediate PDF Download

Printed publication for Next Day or Standard Delivery
Price:  £20 (50% discount for members - click here for more information)

14/30283939 DC

BS EN 15991. Testing of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)

Purchase Options: Immediate PDF Download

Printed publication for Next Day or Standard Delivery
Price:  £20 (50% discount for members - click here for more information)
Product details for 14/30283939 DC
Category: GLASS AND CERAMICS INDUSTRIES

Publication date:

Product detail: 28 pages

ISBN reference: 978 0 580 83139 3

Cross references to standards relating to 14/30283939 DC:

Keywords: Ceramics, Raw materials, Refractory materials, Silicon inorganic compounds, Carbides, Particulate materials, Chemical analysis and testing, Determination of content, Impurities, Trace element analysis, Emission spectrophotometry, Vaporization

Variations and abbreviations: 14/30283939DC,14/30283939 DC

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