14/30299002 DC
14/30299002 DC
   logo
logo

14/30299002 DC

BS EN 60749-44. Semiconductor devices. Mechanical and climatic test methods. Part 44. Neutron beam irradiated single event effect (SEE) test method for semiconductor devices

Purchase Options: Immediate PDF Download

Printed publication for Next Day or Standard Delivery
Price:  £20 (50% discount for members - click here for more information)

14/30299002 DC

BS EN 60749-44. Semiconductor devices. Mechanical and climatic test methods. Part 44. Neutron beam irradiated single event effect (SEE) test method for semiconductor devices

Purchase Options: Immediate PDF Download

Printed publication for Next Day or Standard Delivery
Price:  £20 (50% discount for members - click here for more information)

14/30299002 DC

BS EN 60749-44. Semiconductor devices. Mechanical and climatic test methods. Part 44. Neutron beam irradiated single event effect (SEE) test method for semiconductor devices

Purchase Options: Immediate PDF Download

Printed publication for Next Day or Standard Delivery
Price:  £20 (50% discount for members - click here for more information)
Product details for 14/30299002 DC
Category: ELECTRONICS

Publication date:

Product detail: 19 pages

ISBN reference: 978 0 580 86200 7

Cross references to standards relating to 14/30299002 DC:

Keywords: Semiconductor devices, Integrated circuits, Electronic equipment and components, Mechanical testing, Environmental testing, Climate, Moisture measurement, Gas analysis, Water vapour, Water-vapour tests

Variations and abbreviations: 14/30299002DC,14/30299002 DC

Copyright Standards Centre (SC) © 2019