ASTM E1634 - 11
ASTM E1634 - 11
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ASTM E1634 - 11

Standard Guide for Performing Sputter Crater Depth Measurements

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Printed publication for Next Day or Standard Delivery
Price:  £33 (50% discount for members - click here for more information)

ASTM E1634 - 11

Standard Guide for Performing Sputter Crater Depth Measurements

Purchase Options: Immediate PDF Download

Printed publication for Next Day or Standard Delivery
Price:  £33 (50% discount for members - click here for more information)

ASTM E1634 - 11

Standard Guide for Performing Sputter Crater Depth Measurements

Purchase Options: Immediate PDF Download

Printed publication for Next Day or Standard Delivery
Price:  £33 (50% discount for members - click here for more information)
Product details for ASTM E1634 - 11
Category: CHEMICAL TECHNOLOGY

Publication date:

Product detail: 3 pages

ISBN reference: 978 0 580 79005 8

Cross references to standards relating to ASTM E1634 - 11:

Keywords: Auger electron spectroscopy, Secondary ion mass spectrometry, Stylus profilometry, Surface analysis, X-ray photoelectron spectroscopy

Variations and abbreviations: ASTME1634-11,ASTME1634,ASTM E1634
Standards in the ASTM E1634 series:  ASTM E1634 - 02(2007)   ASTM E1634 - 11  


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