ASTM E2245 - 11e1
ASTM E2245 - 11e1
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ASTM E2245 - 11e1

Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer

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ASTM E2245 - 11e1

Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer

Purchase Options: Immediate PDF Download

Printed publication for Next Day or Standard Delivery
Price:  £53 (50% discount for members - click here for more information)

ASTM E2245 - 11e1

Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer

Purchase Options: Immediate PDF Download

Printed publication for Next Day or Standard Delivery
Price:  £53 (50% discount for members - click here for more information)
Product details for ASTM E2245 - 11e1
Category: TESTING

Publication date:

Product detail: 25 pages

ISBN reference: 978 0 580 84649 6

Cross references to standards relating to ASTM E2245 - 11e1:

Keywords: Cantilevers, Combined standard uncertainty, Fixed-fixed beams, Interferometry, Length measurements, Microelectromechanical systems, MEMS, Polysilicon, Residual strain, Round robin, Stiction, Strain gradient, Test structure

Variations and abbreviations: ASTME2245-11e1,ASTME2245,ASTM E2245
Standards in the ASTM E2245 series:  ASTM E2245 - 11   ASTM E2245 - 05   ASTM E2245 - 11e1   ASTM E2245 - 11(2018)  


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