ASTM E2444 - 11e1
ASTM E2444 - 11e1
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ASTM E2444 - 11e1

Terminology Relating to Measurements Taken on Thin, Reflecting Films

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ASTM E2444 - 11e1

Terminology Relating to Measurements Taken on Thin, Reflecting Films

Purchase Options: Immediate PDF Download

Printed publication for Next Day or Standard Delivery
Price:  £33 (50% discount for members - click here for more information)

ASTM E2444 - 11e1

Terminology Relating to Measurements Taken on Thin, Reflecting Films

Purchase Options: Immediate PDF Download

Printed publication for Next Day or Standard Delivery
Price:  £33 (50% discount for members - click here for more information)
Product details for ASTM E2444 - 11e1
Category:

Publication date:

Product detail: 2 pages

ISBN reference: 978 0 580 80732 9

Cross references to standards relating to ASTM E2444 - 11e1:

Keywords: Cantilevers, Definitions, Fixed-fixed beams, Interferometry, Length measurements, Microelectromechanical systems, MEMS, Polysilicon, Residual strain, Stiction, Strain gradient, Terminology, Test structure

Variations and abbreviations: ASTME2444-11e1,ASTME2444,ASTM E2444
Standards in the ASTM E2444 series:  ASTM E2444 - 05e1   ASTM E2444 - 11e1   ASTM E2444 - 11(2018)  


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