ASTM F980 - 10e1
ASTM F980 - 10e1
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ASTM F980 - 10e1

Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices

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ASTM F980 - 10e1

Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices

Purchase Options: Immediate PDF Download

Printed publication for Next Day or Standard Delivery
Price:  £31.11 (50% discount for members - click here for more information)

ASTM F980 - 10e1

Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices

Purchase Options: Immediate PDF Download

Printed publication for Next Day or Standard Delivery
Price:  £31.11 (50% discount for members - click here for more information)
Product details for ASTM F980 - 10e1
Category: ELECTRONICS

Publication date:

Product detail: 7 pages

ISBN reference: 978 0 580 87966 1

Cross references to standards relating to ASTM F980 - 10e1:

Keywords: Annealing factor, Annealing function, Displacement damage, Integrated circuits, Neutron damage, Neutron degradation, Photoconducting device, Rapid annealing, Semiconductor devices

Variations and abbreviations: ASTMF980-10e1,ASTMF980,ASTM F980
Standards in the ASTM F980 series:  ASTM F980 - 10e1   ASTM F980 - 10   ASTM F980 - 16  


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