BS EN 15991:2015
BS EN 15991:2015
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BS EN 15991:2015

Testing of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)

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BS EN 15991:2015

Testing of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)

Purchase Options: Immediate PDF Download

Printed publication for Next Day or Standard Delivery
Price:  £170 (50% discount for members - click here for more information)

BS EN 15991:2015

Testing of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)

Purchase Options: Immediate PDF Download

Printed publication for Next Day or Standard Delivery
Price:  £170 (50% discount for members - click here for more information)
Product details for BS EN 15991:2015
Category: GLASS AND CERAMICS INDUSTRIES

Publication date:

Product detail: 30 pages

ISBN reference: 978 0 580 83140 9

Cross references to standards relating to BS EN 15991:2015:

Keywords: Ceramics, Raw materials, Refractory materials, Silicon inorganic compounds, Carbides, Particulate materials, Chemical analysis and testing, Determination of content, Impurities, Trace element analysis, Emission spectrophotometry, Vaporization

Variations and abbreviations: BS15991:2015,BS15991,BS 15991
Standards in the BS 15991 series:  BS EN 15991:2015   BS EN 15991:2011  


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