BS EN 60749-40:2011
BS EN 60749-40:2011
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BS EN 60749-40:2011

Semiconductor devices. Mechanical and climatic test methods. Board level drop test method using a strain gauge

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Printed publication for Next Day or Standard Delivery
Price:  £176 (50% discount for members - click here for more information)

BS EN 60749-40:2011

Semiconductor devices. Mechanical and climatic test methods. Board level drop test method using a strain gauge

Purchase Options: Immediate PDF Download

Printed publication for Next Day or Standard Delivery
Price:  £176 (50% discount for members - click here for more information)

BS EN 60749-40:2011

Semiconductor devices. Mechanical and climatic test methods. Board level drop test method using a strain gauge

Purchase Options: Immediate PDF Download

Printed publication for Next Day or Standard Delivery
Price:  £176 (50% discount for members - click here for more information)
Product details for BS EN 60749-40:2011
Category: ELECTRONICS

Publication date:

Product detail: 26 pages

ISBN reference: 978 0 580 64629 4

Cross references to standards relating to BS EN 60749-40:2011:

Keywords: Integrated circuits, Drop tests, Mechanical testing, Semiconductor devices, Electronic equipment and components, Impact testing, Strain measurement, Surface mounting devices, Accelerated testing, Environmental testing, Printed-circuit boards

Variations and abbreviations: BS60749-40:2011,BS60749,BS 60749
Standards in the BS 60749 series:  BS EN 60749-5:2017   BS EN 60749-29:2003   BS EN 60749-30:2005   BS EN 60749-9:2017   BS EN 60749-3:2017  


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