BS EN 62047-10:2011
BS EN 62047-10:2011
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BS EN 62047-10:2011

Semiconductor devices. Micro-electromechanical devices. Micro-pillar compression test for MEMS materials

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Printed publication for Next Day or Standard Delivery
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BS EN 62047-10:2011

Semiconductor devices. Micro-electromechanical devices. Micro-pillar compression test for MEMS materials

Purchase Options: Immediate PDF Download

Printed publication for Next Day or Standard Delivery
Price:  £126 (50% discount for members - click here for more information)

BS EN 62047-10:2011

Semiconductor devices. Micro-electromechanical devices. Micro-pillar compression test for MEMS materials

Purchase Options: Immediate PDF Download

Printed publication for Next Day or Standard Delivery
Price:  £126 (50% discount for members - click here for more information)
Product details for BS EN 62047-10:2011
Category: ELECTRONICS

Publication date:

Product detail: 16 pages

ISBN reference: 978 0 580 69447 9

Cross references to standards relating to BS EN 62047-10:2011:

Keywords: Compression testing, Semiconductor technology, Test specimens, Electronic equipment and components, Stress, Integrated circuits, Electromechanical devices, Semiconductor devices, Strain measurement

Variations and abbreviations: BS62047-10:2011,BS62047,BS 62047
Standards in the BS 62047 series:  BS IEC 62047-29:2017   BS IEC 62047-30:2017   BS EN 62047-25:2016   BS EN 62047-26:2016   BS EN 62047-1:2016  


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