BS IEC 60747-1:2006
Semiconductor devices. General
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Category: Semiconductor devices in general
Publication date: 2009-07-03 Product detail: 46 pages, A4 ISBN reference: 978 0 580 64436 8 Cross references to standards relating to IEC 60747-1:2006: IEC 60027, IEC 60050-521, IEC 60050-702, IEC 60068, IEC 60191-2, IEC 60747, IEC 60748, IEC 60749-26, IEC 61340, QC 001002, ISO 9000, IEC 60050-131, IEC 60134, IEC 60319, IEC 60469-1, IEC 60617-DB Keywords: Semiconductor devices, Integrated circuits, Electronic equipment and components, Terminology, Letters (symbols), Symbols, Ratings, Electric terminals, Position, Identification methods, Colour codes, Measurement, Testing conditions, Reliability, Acceptance (approval), Endurance testing, Electrical measurement, Electrical testing, Electrostatics, Sensitivity, Storage, Marking, Graphic symbols, Labels Variations and abbreviations: BS60747-1:2006,BS60747,IEC 60747-1:2006,IEC 60747,IEC60747-1:2006,IEC60747,BS 60747 |
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Standards in the BS 60747 series:
BS IEC 60747-10:1991
BS IEC 60747-7-5:2005
BS IEC 60747-14-1:2000
BS IEC 60747-1:2006+A1:2010
BS EN 60747-16-4:2004
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