18/30383935 DC
18/30383935 DC
   logo
logo

18/30383935 DC

BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices. Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application

Purchase Options: Immediate PDF Download

Printed publication for Next Day or Standard Delivery
Price:  £20 (50% discount for members - click here for more information)

18/30383935 DC

BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices. Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application

Purchase Options: Immediate PDF Download

Printed publication for Next Day or Standard Delivery
Price:  £20 (50% discount for members - click here for more information)

18/30383935 DC

BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices. Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application

Purchase Options: Immediate PDF Download

Printed publication for Next Day or Standard Delivery
Price:  £20 (50% discount for members - click here for more information)
Product details for 18/30383935 DC
Category: ELECTRONICS

Publication date: 2018-12-04

Product detail: 19 pages

ISBN reference: 978 0 580 74095 4

Cross references to standards relating to 18/30383935 DC:

Keywords: Durability, Sensors, Thin films, Test methods, Semiconductor devices

Variations and abbreviations: 18/30383935DC,18/30383935 DC

Copyright Standards Centre (SC) © 2019