19/30364443 DC
19/30364443 DC
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19/30364443 DC

BS EN IEC 62047-35. Semiconductor devices. Micro-electromechanical devices. Part 35. Test method of electrical characteristics under bending deformation for flexible and foldable electro-mechanical devices

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19/30364443 DC

BS EN IEC 62047-35. Semiconductor devices. Micro-electromechanical devices. Part 35. Test method of electrical characteristics under bending deformation for flexible and foldable electro-mechanical devices

Purchase Options: Immediate PDF Download

Printed publication for Next Day or Standard Delivery
Price:  £20 (50% discount for members - click here for more information)

19/30364443 DC

BS EN IEC 62047-35. Semiconductor devices. Micro-electromechanical devices. Part 35. Test method of electrical characteristics under bending deformation for flexible and foldable electro-mechanical devices

Purchase Options: Immediate PDF Download

Printed publication for Next Day or Standard Delivery
Price:  £20 (50% discount for members - click here for more information)
Product details for 19/30364443 DC
Category: ELECTRONICS

Publication date: 2019-01-04

Product detail: 19 pages

ISBN reference: 978 0 580 98221 7

Cross references to standards relating to 19/30364443 DC:

Keywords: Semiconductor technology, Electromechanical devices, Deformation, Test methods, Semiconductor devices

Variations and abbreviations: 19/30364443DC,19/30364443 DC

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