ASTM F1192 - 11
ASTM F1192 - 11
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ASTM F1192 - 11

Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices

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ASTM F1192 - 11

Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices

Purchase Options: Immediate PDF Download

Printed publication for Next Day or Standard Delivery
Price:  £41 (50% discount for members - click here for more information)

ASTM F1192 - 11

Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices

Purchase Options: Immediate PDF Download

Printed publication for Next Day or Standard Delivery
Price:  £41 (50% discount for members - click here for more information)
Product details for ASTM F1192 - 11
Category: ELECTRONICS

Publication date: 2011-01-10

Product detail: 11 pages

ISBN reference: 978 0 580 77235 1

Cross references to standards relating to ASTM F1192 - 11:

Keywords: SEB, SEE, SEFI, SEGR, SEL, SEP, SEP cross section, SEU, Single event, Single event effect, Single event phenomena, Single event upset, Space environment: Destructive testing-semiconductors, Dosimetry, Electrical conductors (semiconductors), Electron radiation, Failure end point-electronic components/devices, Fluence, Galactic cosmic rays, Germanium-semiconductor applications, Integrated circuits, Ionizing radiation, Irradiance/irradiation-semiconductors, Linear energy transfer (LET), Radiation exposure-electronic components/devices, Silicon semiconductors, Single crystal silicon semiconductors, Single-event phenomenon (SEP), Solar flares, Upset threshold

Variations and abbreviations: ASTMF1192-11,ASTMF1192,ASTM F1192
Standards in the ASTM F1192 series:  ASTM F1192 - 00(2006)   ASTM F1192 - 11   ASTM F1192 - 11(2018)  


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