ASTM F1467 - 11
ASTM F1467 - 11
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ASTM F1467 - 11

Standard Guide for Use of an X-Ray Tester (10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits

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ASTM F1467 - 11

Standard Guide for Use of an X-Ray Tester (10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits

Purchase Options: Immediate PDF Download

Printed publication for Next Day or Standard Delivery
Price:  £41 (50% discount for members - click here for more information)

ASTM F1467 - 11

Standard Guide for Use of an X-Ray Tester (10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits

Purchase Options: Immediate PDF Download

Printed publication for Next Day or Standard Delivery
Price:  £41 (50% discount for members - click here for more information)
Product details for ASTM F1467 - 11
Category: ELECTRONICS

Publication date: 2011-01-10

Product detail: 18 pages

ISBN reference: 978 0 580 77126 2

Cross references to standards relating to ASTM F1467 - 11:

Keywords: Ionizing radiation effects, Microcircuits, Radiation hardness, Semiconductor devices, X-ray testing: Collimator/collimation, Electrical conductors (semiconductors), Electronic hardness, Experimental design/evaluation, Ionizing radiation, Low-energy radiation, Microcircuits, Microelectronic devices, Radiation exposure-electronic components/devices, Radiation-hardness testing, Semiconductor device testing, X-ray testing

Variations and abbreviations: ASTMF1467-11,ASTMF1467,ASTM F1467
Standards in the ASTM F1467 series:  ASTM F1467 - 99(2005)   ASTM F1467 - 11   ASTM F1467 - 18  


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