ASTM F1893 - 11
ASTM F1893 - 11
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ASTM F1893 - 11

Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices

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ASTM F1893 - 11

Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices

Purchase Options: Immediate PDF Download

Printed publication for Next Day or Standard Delivery
Price:  £36 (50% discount for members - click here for more information)

ASTM F1893 - 11

Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices

Purchase Options: Immediate PDF Download

Printed publication for Next Day or Standard Delivery
Price:  £36 (50% discount for members - click here for more information)
Product details for ASTM F1893 - 11
Category: ELECTRONICS

Publication date: 2011-01-01

Product detail: 7 pages

ISBN reference: 978 0 580 74834 9

Cross references to standards relating to ASTM F1893 - 11:

Keywords: Burnout, Failure, High dose-rate, Integrated circuits, Ionizing radiation, Latchup, Microcircuits, Semiconductor devices, Survivability

Variations and abbreviations: ASTMF1893-11,ASTMF1893,ASTM F1893
Standards in the ASTM F1893 series:  ASTM F1893 - 98(2003)   ASTM F1893 - 11   ASTM F1893 - 18  


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