BS EN 62047-12:2011
BS EN 62047-12:2011
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BS EN 62047-12:2011

Semiconductor devices. Micro-electromechanical devices. Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures

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BS EN 62047-12:2011

Semiconductor devices. Micro-electromechanical devices. Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures

Purchase Options: Immediate PDF Download

Printed publication for Next Day or Standard Delivery
Price:  £214 (50% discount for members - click here for more information)

BS EN 62047-12:2011

Semiconductor devices. Micro-electromechanical devices. Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures

Purchase Options: Immediate PDF Download

Printed publication for Next Day or Standard Delivery
Price:  £214 (50% discount for members - click here for more information)
Product details for BS EN 62047-12:2011
Category: ELECTRONICS

Publication date: 2011-11-30

Product detail: 34 pages

ISBN reference: 978 0 580 76301 4

Cross references to standards relating to BS EN 62047-12:2011:

Keywords: Semiconductor devices, Electronic equipment and components, Electromechanical devices, Semiconductor technology, Integrated circuits, Thin-film devices, Fatigue testing, Bend testing, Resonance, Vibration, Test specimens, Test equipment

Variations and abbreviations: BS62047-12:2011,BS62047,BS 62047
Standards in the BS 62047 series:  BS IEC 62047-36:2019   BS IEC 62047-34:2019   BS IEC 62047-33:2019   BS IEC 62047-31:2019   BS IEC 62047-32:2019  


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