IEC 60749-30:2020
IEC 60749-30:2020
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BS EN IEC 60749-30:2020

Semiconductor devices. Mechanical and climatic test methods. Preconditioning of non-hermetic surface mount devices prior to reliability testing

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BS EN IEC 60749-30:2020

Semiconductor devices. Mechanical and climatic test methods. Preconditioning of non-hermetic surface mount devices prior to reliability testing

Purchase Options: Immediate PDF Download

Printed publication for Next Day or Standard Delivery
Price:  £134 (50% discount for members - click here for more information)

BS EN IEC 60749-30:2020

Semiconductor devices. Mechanical and climatic test methods. Preconditioning of non-hermetic surface mount devices prior to reliability testing

Purchase Options: Immediate PDF Download

Printed publication for Next Day or Standard Delivery
Price:  £134 (50% discount for members - click here for more information)
Product details for IEC 60749-30:2020
Category: ELECTRONICS

Publication date: 2020-09-30

Product detail: 18 pages

ISBN reference: 978 0 539 04583 3

Cross references to standards relating to IEC 60749-30:2020:

Keywords: Semiconductor devices, Surface mounting devices, Electronic equipment and components, Environmental testing, Reliability, Specimen preparation, Performance testing, Integrated circuits, Climate, Mechanical testing

Variations and abbreviations: BS60749-30:2020,BS60749,IEC 60749-30:2020,IEC 60749,IEC60749-30:2020,IEC60749,BS 60749
Standards in the BS 60749 series:  BS EN 60749-29:2003   BS EN 60749-30:2005   BS EN 60749-7:2002   BS EN 60749-34:2004   BS EN 60749-32:2003  


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